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pennae 55e07712e5 rp: fix adc test flakiness 
GP29 is connected to the cyw43 SCK pin. cyw43 is selected by
default (due to rp2040 pins being input/pulldown by default), so the
wifi chip is always selected and watches the SCK pin. this little bit of
load on the SCK pin is enough to disturb the 300k voltage divider used
for VSYS sensing, making the test flaky.
2023-08-03 23:38:23 +02:00
..
adc.rs rp: fix adc test flakiness 2023-08-03 23:38:23 +02:00
cyw43-perf.rs cyw43: Update firmware in HIL test. 2023-07-28 23:58:47 +02:00
dma_copy_async.rs ci: run HIL tests in parallel. 2023-05-30 01:10:53 +02:00
flash.rs rp: add async flash 2023-07-28 16:50:54 -06:00
float.rs rp: update rp-pac. 2023-06-16 01:41:07 +02:00
gpio.rs rp/gpio: fix is_set_high/is_set_low, expand tests. 2023-07-11 12:40:07 +02:00
gpio_async.rs ci: run HIL tests in parallel. 2023-05-30 01:10:53 +02:00
gpio_multicore.rs ci: run HIL tests in parallel. 2023-05-30 01:10:53 +02:00
multicore.rs ci: run HIL tests in parallel. 2023-05-30 01:10:53 +02:00
pio_irq.rs rp: relocate programs implicitly during load 2023-07-28 19:33:02 +02:00
pio_multi_load.rs rp: relocate programs implicitly during load 2023-07-28 19:33:02 +02:00
pwm.rs ci: run HIL tests in parallel. 2023-05-30 01:10:53 +02:00
spi.rs ci: run HIL tests in parallel. 2023-05-30 01:10:53 +02:00
spi_async.rs ci: run HIL tests in parallel. 2023-05-30 01:10:53 +02:00
uart.rs ci: run HIL tests in parallel. 2023-05-30 01:10:53 +02:00
uart_buffered.rs ci: run HIL tests in parallel. 2023-05-30 01:10:53 +02:00
uart_dma.rs ci: run HIL tests in parallel. 2023-05-30 01:10:53 +02:00
uart_upgrade.rs ci: run HIL tests in parallel. 2023-05-30 01:10:53 +02:00